HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks. Our HAST systems have a modern design that's easier to use:

• Automatic humidity filling
• Automatic door lock
• A round workspace, allowing wider sample boards to be loaded
• Convenient, hermetic power-pin system for bias testing

We now offer an "Air HAST" modification for faster testing of lead-free solder whisker resistance to humidity.

Features for HAST - Highly Accelerated Stress Test Chambers

• Unsaturated or saturated humidity control
• Multi-mode 'M' system controls humidity (via wet bulb/dry bulb), even during heat-up and cool-down. Fully conforms to EIA/JEDEC test method A110 & 102C.
• Touch-screen controller with temperature, humidity, and count-down display. Includes Ethernet interface.
• Language selection of English, Japanese, Chinese, or Korean
• Specimen power terminals, allow power-up of specimens

Cabinet Features:

• Inner cylinder and door shield protect specimens from dew condensation
• Interior is cylindrical for maximum product loading
• Two stainless steel shelves
• Set of casters for easy movement of the chamber (except double units)

Safety Features:

• Overheat & over-pressure protectors
• Door lock safety mechanism to prevent opening of the door while the chamber is pressurized
• Specimen power control terminal: shuts down the product power in the event of an alarm